Yameng is a Senior Scientist at the National Physical Laboratory (NPL) and team leader in the development of scalable metrology for semiconductor materials and devices. Yameng is the lead scientist on a patent-pending spectral imaging technology and was recently chosen by Silicon Catalyst to be incubated as a potential start-up under the ChipStart program backed by the UK government.

Abstract: Scaling-up imaging-metrology for quantum and photonic materials

The development of materials for quantum and photonic applications is facing its greatest challenge: scale-up, the process of translating lab-scale research to commercial and industrial-scale uptake. This talk will focus on the challenges and opportunities relevant to the scale-up of optically active semiconductors, relevant to photonic and quantum applications.