Fast pixellated direct electron detectors are becoming increasingly common in modern transmission electron microscopes and have been the catalyst for numerous advances in the way that STEM experiments are performed.  These range from ptychographic techniques in which sub-Angstrom resolution images are recovered, to scanning diffraction studies from which crystallography and strain are measured with nano-meter spatial resolution from relatively large sample areas.

In this talk I will give an overview of the state of the art in 4DSTEM experiments with examples of their application to a wide range of functional materials from experiments performed at ePSIC. I will introduce some of the ongoing 4DSTEM development work at ePSIC including progress towards automation and correlative multimodal experiments.