Dr Jessica Boland is a UKRI Future Leader Fellow and Senior Lecturer in Functional Materials and Devices based within the Photon Science Institute at University of Manchester. Her current research focuses on nanoscale optoelectronic characterisation of low-dimensional materials, including III-V nanostructures, 2D materials and topological insulators, via scattering-type scanning near-field optical microscopy (s-SNOM) and terahertz spectroscopy, as well as their application in terahertz devices. She is the technical academic lead for the CUSTOM facility at Manchester, which hosts a suite of cryogenic and room-temperatures s-SNOMs that provide a unique tool for examining the optoelectronic properties of advanced materials with sub-picosecond temporal resolution, nanometre spatial resolution and surface-sensitivity across the visible to terahertz wavelength ranges.